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Microelectronic reliability

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Microelectronic reliability


Publication date
Topics
Semiconductors -- Reliability
Publisher
Norwood, MA : Artech House
Collection
inlibrary; printdisabled; internetarchivebooks
Digitizing sponsor
Kahle/Austin Foundation
Contributor
Internet Archive
Language
English; Italian
Volume
1
2 v. : 24 cm

Vol. 2. translation of: L'affidabilità dei componenti elettronici a semiconduttore

Includes bibliographies and indexes

v. 1. Reliability, test and diagnostics [edited by] Edward B. Hakim -- v. 2. Integrity assessment and assurance / [edited by] Emiliano Pollino

Notes

Cut-off text on some pages due to tight binding

Access-restricted-item
true
Addeddate
2022-05-28 15:18:36
Associated-names
Hakim, Edward B; Pollino, Emiliano
Autocrop_version
0.0.13_books-20220331-0.2
Bookplateleaf
0004
Boxid
IA40517605
Camera
Sony Alpha-A6300 (Control)
Collection_set
printdisabled
External-identifier
urn:lcp:microelectronicr0001unse:lcpdf:2cf12390-b48c-4f58-8aaa-667d570862af
urn:lcp:microelectronicr0001unse:epub:12b958da-a354-4b30-bb9f-1a20ccae2e28
Foldoutcount
0
Identifier
microelectronicr0001unse
Identifier-ark
ark:/13960/s2x59bhjsjx
Full catalog record
MARCXML

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